Prime FZ-Si Wafer
Size: 4”, Orientation: (111), None Doped, 2-Side Polished, Thickness: 300 ± 20 μm
Technical Properties:
| Resistivity (ohm.cm) |
|
| 10000 – 100000 |
|
Description
Float zone (FZ) silicon is a highly pure silicon produced by vertical zone melting.
Compared to the Czochralski method, FZ silicon crystals have higher purity.
Light impurities in FZ Si wafers allow control of certain defects and improve mechanical strength.
Flat zone silicons have very high resistivity distribution, making them especially suitable for detectors.
Other properties, such as minority carrier lifetime and bulk generation current, are important to reduce detector noise.
However, these properties are secondary to the wafer’s crystalline structure and purity.
Multiple zone refining can be performed on a rod to further reduce impurity concentrations.
For larger inquiries, please contact us.
Download ……………………….. MSDS
