Silicon Carbide Wafer (SiC-4H) – 4H Specifications
Product Parameters Table
| Parameter | Specification |
|---|---|
| Product | Silicon Carbide Wafer (SiC-4H) – 4H |
| Quality | Production Grade |
| Size (inch) | 2” |
| Thickness (μm) | 350 |
| Ra | ≤0.3 |
| 4H Area | 1 |
| Orientation | 4° ± 0.5° |
| Resistivity | 0.015 – 0.03 Ω·cm |
| TTV | ≤10 |
| Bow | ≤10 |
| Warp | ≤25 |
| OF Length | 16 ± 2 mm |
| IF Length | 8 ± 1 mm |
Fields of Application – Summary
Silicon Carbide (SiC) 4H wafers are synthetic Si–C compound wafers valued for:
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Excellent electrical and thermal conductivity
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Low thermal expansion
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Extreme hardness
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High-temperature stability
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Resistance to corrosion, erosion, and oxidation
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High brilliance (shinier than diamond or cubic zirconia)
Common Applications
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High-temperature and high-radiation semiconductor devices
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High-power and high-frequency electronics
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Short-wavelength opto-electronic devices (UV LEDs, detectors)
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III-nitride epitaxy due to low lattice mismatch
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Combustion monitoring sensors
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Very high-voltage and high-power devices (diodes, power transistors, microwave devices)
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Hybrid/electric vehicle power electronics
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Green energy systems (solar inverters, power modules)
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LED manufacturing
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Emerging advanced semiconductor markets












